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Name
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Yu-Ta
Chen
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Title
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Assistant
Professor
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Office
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K410
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Phone
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886-6-2533131
Ext. 3571
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Email
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yutachen@stust.edu.tw
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Webpage
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Education
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Ph.D.,
Institute of mechanical engineering, National Chung Cheng University
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Research Interests
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Precision
Measurement, Geometric Error Measurement and System Design For Machine
Tools, Automated Optical Inspection, Optical system design, Precision
Mechanical Metrology
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Laboratory
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Publications
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Journal
Papers
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1. C.
M. Jan, C. L. Chen, Y. T. Chen,
and C. S. Liu, “Optical interference system for simultaneously measuring
refractive index and thickness of slim transparent plate,” Optics and
Lasers in Engineering, Accepted 2021 (SCI,
Impact Factor: 4.273, Rank: 15/97) OPTICS.
2. Y. T. Chen,
P. More, C. S. Liu and C. C. Cheng, “Identification and compensation of
position-dependent geometric errors of rotary axes on five-axis machine
tools by using a touch-trigger probe and three spheres,” The International
Journal of Advanced Manufacturing Technology, vol. 102, pp. 3077-3089, 2019
(SCI, Impact Factor: 2.633, Rank:
25/50) ENGINEERING, MANUFACTURING.
3. Y. T. Chen,
P. More and C. S. Liu, “Identification and verification of location errors
of rotary axes on five-axis machine tools by using a touch-trigger probe
and a sphere,” The International Journal of Advanced Manufacturing
Technology, vol. 100, pp. 2653-2667, 2019 (SCI, Impact Factor: 2.633, Rank: 25/50) ENGINEERING,
MANUFACTURING.
4. C.
S. Liu, Y. F. Pu, Y. T. Chen
and Y. T. Luo, “Design of a measurement system for simultaneously measuring
six-degree-of-freedom geometric errors of a long linear stage,” Sensors,
vol. 18, pp. 3875, 2018 (SCI, Impact
Factor: 3.275, Rank: 15/64) INSTRUMENTS & INSTRUMENTATION.
5. C.
S. Liu, Z. Y. Wang, and Y. T.
Chen, “Novel system for simultaneously measuring the thickness and
refractive index of a transparent plate with two optical paths,” Applied
Physics B, vol. 124, no. 9, pp. 180, 2018. (SCI, Impact Factor: 1.817, Rank: 58/94) OPTICS.
6. C.
L. Hsieh, Y. H. Chang, Y. T. Chen, and C. S. Liu, “Design of VCM
actuator with L-shape coil for smartphone cameras,” Microsystem
Technologies, vol. 24, no. 2, pp. 1033-1040, 2018 (SCI, Impact Factor: 1.737, Rank: 162/266) ENGINEERING,
ELECTRICAL & ELECTRONIC.
7. Y. T. Chen,
W. C. Lin, and C. S. Liu, “Design and experimental verification of novel
six-degree-of freedom geometric error measurement system for linear stage,”
Optics and Lasers in Engineering, vol. 92, pp. 94-104, 2017 (SCI, Impact Factor: 4.273, Rank: 15/97)
OPTICS.
8.
Y.
T. Chen, Y. S. Huang, and C. S. Liu, “An optical sensor
for measuring the position and slanting direction of flat surfaces,”
Sensors, vol. 16, no. 7, pp. 1061-1-1061-13, 2016 (SCI, Impact Factor: 3.275, Rank: 15/64) INSTRUMENTS &
INSTRUMENTATION.
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Conference
Papers
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- Y.
T. Chen,
T. H. Hsieh, P. E. Hsu and J. R. Chen, “A Novel and Robust Geometric
Errors Measurement Method for a Swiveling Rotary Table by Using a Self
Tracking Laser Interferometer,” The International Multi-Conference on
Engineering and Technology Innovation (IMETI 2020), B203 (Taichung,
Taiwan, October 23-27, 2020).
- T. H. Hsieh, K. Y. Huang, J.
W. Huang, Y. T. Chen
and P. E. Hsu, “A New Angular Method for Measuring Position Error of
Rotary Axis,” The International Multi-Conference on Engineering and
Technology Innovation (IMETI 2020), J225 (Taichung, Taiwan, October
23-27, 2020).
- T. H. Hsieh, J. W. Huang, K.
Y. Huang, Y. T. Chen
and P. E. Hsu, “Rotray Encoder Calibration,” The International
Multi-Conference on Engineering and Technology Innovation (IMETI
2020), J224 (Taichung, Taiwan, October 23-27, 2020).
- T. H. Hsieh, J. R. Chen, Y. T. Chen and P. E.
Hsu, “Errors Model of a Rotary Axis by Using Multiple Optical
Readers,” The International Multi-Conference on Engineering and
Technology Innovation (IMETI 2019), J9023 (Kaohsiung, Taiwan, November
15-19, 2019).
- Y.
T. Chen,
T. H. Hsieh, J. R. Chen, P. E. Hsu and B. L. Ho, “A New Geometric
Errors Measurement of a Rotary Table by LaserTRACER,” The
International Multi-Conference on Engineering and Technology
Innovation (IMETI 2019), J9022 (Kaohsiung, Taiwan, November 15-19,
2019).
- Y.
T. Chen,
P. More, C. S. Liu, and C. C. Cheng “Development of experimental
measurement strategy to analyze the measurement method of location
errors of rotary C-axis on five-axis machine tools,” Proceedings of
2019 Engineering Mechanics Institute International Conference (EMI
2019), p. 266. (Lyon, France, July 3-5, 2019).
- C. C. Cheng, Y. S. Chiu, M.
S. Tsai, Y. T. Chen,
and C. S. Liu “Natural frequency identifications of spindle-toolsystem
of machine tools during machining,” Proceedings of 2019 Engineering
Mechanics Institute International Conference (EMI 2019), p. 223.
(Lyon, France, July 3-5, 2019).
- C. S. Liu, Y. T. Luo, Y. T. Chen and Y. F.
Pu, “Measurement of six-degree-of-freedom geometric error for a
machine tool,” Proceedings of2018 IEEE International Conference on
Advanced Manufacturing (IEEE ICAM 2018), pp. T180004. (Yunlin, Taiwan,
November 16-18, 2018).
- C. S. Liu*, Y. F. Pu, Y. T. Chen and Y. T.
Luo, “Design of a measurement system for simultaneously measuring
six-degree-of-freedom geometric errors of a long linear stage,”
Proceedings of the 6th International Symposium on Sensor Science 2018
(I3S2018), pp. sciforum-017939. (Kenting, Taiwan, August 06-08, 2018).
- C. S. Liu, Z. Y. Wang, and Y. T. Chen, “Optical
sensor for simultaneous refractive index and thickness measurement,”
Proceedings of the International Symposium on Optomechatronic
Technology 2017 (ISOT2017), pp. AQ-05. (Tainan, Taiwan, November
05-09, 2017).
- C. L. Hsieh, Y. H. Chang, Y. T. Chen, and C. S.
Liu*, “Design of VCM actuator with the L-shape coil for smartphone
cameras,” Proceedings of the IEEE International Magnetics Conference
2017 (INTERMAG 2017), pp. HT-06. (Dublin, Ireland, April 24-28, 2017).
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Projects
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Year
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Project Title
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Budget
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Period
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Patents
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1.
C.
S. Liu, Y. T. Chen and Y.
X. Lin, “Multi-degree-of-freedom error measurement system for rotary axes
and method thereof,” U.S. Patent, under review 16018436.
2.
C.
S. Liu, Y. T. Chen, Y. T.
Luo, and Y. F. Pu, “Method and apparatus for measuring errors of movable
platform in multiple degrees of freedom,” US Patent, 10502559 B2,
2019/12/10.
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